Shailaja Patil Author & Editor

Archana Mire is presently working as Head, Department of computer engineering, Terna Engineering College, Navi Mumbai, India. She has more than 14 years of research and teaching experience. She has published research papers in various SCI/Scopus indexed national/international conferences and journals. She has worked on various national/International conference technical committees and reviewed papers for various conferences and journals. She has served as a session chair for various international conferences organized within and outside India. Her main research area is machine learning and image processing.

Vinayak Elangovan is currently working as an assistant professor of Computer Science at Penn State University in Abington, USA. He earned his Ph.D. in Computer Information Systems Engineering at Tennessee State University, the USA in 2014, and continued his research and teaching there as a Postdoctoral fellow. He worked at The College of New Jersey (TCNJ) and St. Olaf College teaching various computer science courses for undergraduate students during 2015-2017. His research interest includes computer vision, machine vision, multi-sensor data fusion, and activity sequence analysis with a keen interest in software applications development and database management. He has worked on a number of funded projects related to the Department of Defense and the Department of Homeland Security applications. He also has considerable work experience in the engineering and software industries.

Shailaja Patil is currently working as a professor, department of electronics and telecommunication, and Dean (Research and Development), Rajarshi Shahu College of Engineering, Pune, India. She has 25 years of teaching and 3 years of research experience. She has more than 60 publications in peer-reviewed journals. She has delivered expert lectures on WSN, SDN, and Intellectual property Rights at various workshops. She is a Fellow of the Institution of Engineers and members of various professional bodies- IEEE, ISTE, GISFI, ISA, ACM, etc.