Radar Scattering and Imaging of Rough Surfaces
Kun-Shan Chen - Paperback
£51.99
Kun-Shan Chen received a PhD degree in electrical engineering from the University of Texas at Arlington in 1990. From 1992 to 2014, he was with the faculty of National Central University, Taiwan. He joined the Institute of Remote Sensing and Digital Earth, Chinese Academy of Science, in 2014, and has served the Department of Electrical Engineering, The University of Texas at Arlington, USA, as a research professor since 2014. He has authored or coauthored over 120 journal papers, contributed seven book chapters, is a coauthor of one book, and a fellow of The Institute of Electrical and Electronics Engineers (IEEE).