Advanced Mathematical And Computational Tools In Metrology And Testing Ix

Alistair B Forbes editor Franco Pavese editor Markus Baer editor Leslie Pendrill editor Jean-remy Filtz editor Kastsuhiro Shirono editor

Format:Hardback

Publisher:World Scientific Publishing Co Pte Ltd

Published:27th Mar '12

Currently unavailable, and unfortunately no date known when it will be back

Advanced Mathematical And Computational Tools In Metrology And Testing Ix cover

This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in Göteborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in testing.The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also in keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards.

ISBN: 9789814397940

Dimensions: unknown

Weight: unknown

468 pages