VLSI Design and Test
23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
Anirban Sengupta editor Virendra Singh editor Rohit Sharma editor Sudeb Dasgupta editor Santosh Kumar Vishvakarma editor
Format:Paperback
Publisher:Springer Verlag, Singapore
Published:18th Aug '19
Currently unavailable, and unfortunately no date known when it will be back
This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.
The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
ISBN: 9789813297661
Dimensions: unknown
Weight: unknown
775 pages
1st ed. 2019