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Terrestrial Neutron-induced Soft Error In Advanced Memory Devices

Takashi Nakamura author Eishi Ibe author Mamoru Baba author Yasuo Yahagi author Hideaki Kameyama author

Format:Hardback

Publisher:World Scientific Publishing Co Pte Ltd

Published:3rd Apr '08

Currently unavailable, and unfortunately no date known when it will be back

Terrestrial Neutron-induced Soft Error In Advanced Memory Devices cover

Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.

ISBN: 9789812778819

Dimensions: unknown

Weight: unknown

368 pages