Terrestrial Neutron-induced Soft Error In Advanced Memory Devices
Takashi Nakamura author Eishi Ibe author Mamoru Baba author Yasuo Yahagi author Hideaki Kameyama author
Format:Hardback
Publisher:World Scientific Publishing Co Pte Ltd
Published:3rd Apr '08
Currently unavailable, and unfortunately no date known when it will be back
Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.
ISBN: 9789812778819
Dimensions: unknown
Weight: unknown
368 pages