VLSI Design and Test

22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers

Virendra Singh editor S Rajaram editor NB Balamurugan editor D Gracia Nirmala Rani editor

Format:Paperback

Publisher:Springer Verlag, Singapore

Published:25th Jan '19

Currently unavailable, and unfortunately no date known when it will be back

VLSI Design and Test cover

This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018.
The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.

ISBN: 9789811359491

Dimensions: unknown

Weight: unknown

722 pages

1st ed. 2019