Atomic Force Microscopy in Adhesion Studies
Kash L Mittal editor J Drelich editor
Format:Hardback
Publisher:Brill
Published:1st Oct '05
Currently unavailable, and unfortunately no date known when it will be back
Since its discovery, Atomic Force Microscopy (AFM) has become a technique of choice for non-destructive surface characterization with sub-molecular resolution. The AFM has also emerged as a problem-solving tool in applications relevant to particle-solid and particle-liquid interactions, design, fabrication, and characterization of new materials, and development of new technologies for processing and modification of materials. This volume is a comprehensive review of AFM techniques and their application in adhesion studies. It is intended for both researchers and students in engineering disciplines, physics and biology. Over 100 authors contributed to this book, summarizing current status of research on measurements of colloidal particle-solid adhesion and molecular forces, solid surface imaging and mapping, and discussing the contact mechanics models applicable to particle-substrate and particle-particle systems.
'The coverage of this book is comprehensive and provides an excellent resource for researchers in adhesion studies.'
Adhesives & Sealants Newsletter, 2006.
'This volume offers a comprehensive review of AFM techniques and their application in adhesion…a reference for AFM techniques for both researchers and students in engineering disciplines, physics and biology.'
Rapra Abstracts, 2006.
ISBN: 9789067644341
Dimensions: unknown
Weight: 1680g
822 pages