Optical Admittance Loci Monitoring for Thin Film Deposition

Cheng-Chung Lee author Kai Wu author Tzu-Ling Ni author

Format:Paperback

Publisher:LAP Lambert Academic Publishing

Published:9th May '12

Currently unavailable, and unfortunately no date known when it will be back

Optical Admittance Loci Monitoring for Thin Film Deposition cover

This paperback, "Optical Admittance Loci Monitoring for Thin Film Deposition" from Cheng-Chung Lee, Kai Wu & Tzu-Ling Ni, was published 9th May 2012 by LAP Lambert Academic Publishing.

ISBN: 9783659001987

Dimensions: 229mm x 152mm x 9mm

Weight: 227g

148 pages