Optical Admittance Loci Monitoring for Thin Film Deposition
Cheng-Chung Lee author Kai Wu author Tzu-Ling Ni author
Format:Paperback
Publisher:LAP Lambert Academic Publishing
Published:9th May '12
Currently unavailable, and unfortunately no date known when it will be back
This paperback, "Optical Admittance Loci Monitoring for Thin Film Deposition" from Cheng-Chung Lee, Kai Wu & Tzu-Ling Ni, was published 9th May 2012 by LAP Lambert Academic Publishing.
ISBN: 9783659001987
Dimensions: 229mm x 152mm x 9mm
Weight: 227g
148 pages