Metrology and Standardization for Nanotechnology

Protocols and Industrial Innovations

Marcel Van de Voorde editor Elisabeth Mansfield editor Debra L Kaiser editor Daisuke Fujita editor

Format:Hardback

Publisher:Wiley-VCH Verlag GmbH

Published:8th Feb '17

Currently unavailable, and unfortunately no date known when it will be back

Metrology and Standardization for Nanotechnology cover

For the promotion of global trading and the reduction of potential risks, the role of international standardization of nanotechnologies has become more and more important. This book gives an overview of the current status of nanotechnology including the importance of metrology and characterization at the nanoscale, international standardization of nanotechnology, and industrial innovation of nano-enabled products.
First the field of nanometrology, nanomaterial standardization and nanomaterial innovation is introduced. Second, major concepts in analytical measurements are given in order to provide a basis for the reliable and reproducible characterization of nanomaterials. The role of standards organizations are presented and finally, an overview of risk management and the commercial impact of metrology and standardization for industrial innovations.

ISBN: 9783527340392

Dimensions: 252mm x 178mm x 36mm

Weight: 1520g

626 pages