Lock-in Thermography
Basics and Use for Evaluating Electronic Devices and Materials
Otwin Breitenstein author Wilhelm Warta author Martin C Schubert author
Format:Hardback
Publisher:Springer International Publishing AG
Published:22nd Jan '19
Currently unavailable, and unfortunately no date known when it will be back
This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.
ISBN: 9783319998244
Dimensions: unknown
Weight: 682g
321 pages
3rd ed. 2018