Lock-in Thermography

Basics and Use for Evaluating Electronic Devices and Materials

Otwin Breitenstein author Wilhelm Warta author Martin C Schubert author

Format:Hardback

Publisher:Springer International Publishing AG

Published:22nd Jan '19

Currently unavailable, and unfortunately no date known when it will be back

Lock-in Thermography cover

This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.

ISBN: 9783319998244

Dimensions: unknown

Weight: 682g

321 pages

3rd ed. 2018