Structural, Syntactic, and Statistical Pattern Recognition
Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings
Richard Wilson editor Marco Loog editor Antonio Robles-Kelly editor Battista Biggio editor Francisco Escolano editor
Format:Paperback
Publisher:Springer International Publishing AG
Published:5th Nov '16
Currently unavailable, and unfortunately no date known when it will be back
This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntactic, and Statistical Pattern Recognition, S+SSPR 2016, consisting of the International Workshop on Structural and Syntactic Pattern Recognition SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The 51 full papers presented were carefully reviewed and selected from 68 submissions. They are organized in the following topical sections: dimensionality reduction, manifold learning and embedding methods; dissimilarity representations; graph-theoretic methods; model selection, classification and clustering; semi and fully supervised learning methods; shape analysis; spatio-temporal pattern recognition; structural matching; text and document analysis.
ISBN: 9783319490540
Dimensions: unknown
Weight: unknown
588 pages
1st ed. 2016