Structural, Syntactic, and Statistical Pattern Recognition

Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings

Richard Wilson editor Marco Loog editor Antonio Robles-Kelly editor Battista Biggio editor Francisco Escolano editor

Format:Paperback

Publisher:Springer International Publishing AG

Published:5th Nov '16

Currently unavailable, and unfortunately no date known when it will be back

Structural, Syntactic, and Statistical Pattern Recognition cover

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntactic, and Statistical Pattern Recognition, S+SSPR 2016, consisting of the International Workshop on Structural and Syntactic Pattern Recognition SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The 51 full papers presented were carefully reviewed and selected from 68 submissions. They are organized in the following topical sections: dimensionality reduction, manifold learning and embedding methods; dissimilarity representations; graph-theoretic methods; model selection, classification and clustering; semi and fully supervised learning methods; shape analysis; spatio-temporal pattern recognition; structural matching; text and document analysis. 

ISBN: 9783319490540

Dimensions: unknown

Weight: unknown

588 pages

1st ed. 2016