VLSI Design and Test
26th International Symposium, VDAT 2022, Jammu, India, July 17–19, 2022, Revised Selected Papers
Sudeb Dasgupta editor Ambika Prasad Shah editor Anand Darji editor Jaynarayan Tudu editor
Format:Paperback
Publisher:Springer International Publishing AG
Published:17th Dec '22
Currently unavailable, and unfortunately no date known when it will be back
This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022.
The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.
ISBN: 9783031215131
Dimensions: unknown
Weight: unknown
596 pages
1st ed. 2022