Design for Testability, Debug and Reliability
Next Generation Measures Using Formal Techniques
Sebastian Huhn author Rolf Drechsler author
Format:Paperback
Publisher:Springer Nature Switzerland AG
Published:20th Apr '22
Currently unavailable, and unfortunately no date known when it will be back
This paperback is available in another edition too:
- Hardback£89.99(9783030692087)
This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces.
ISBN: 9783030692117
Dimensions: unknown
Weight: unknown
164 pages
1st ed. 2021