Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
Samir Kumar editor Chandra Shakher Pathak editor
Format:Hardback
Publisher:IntechOpen
Published:7th Jan '22
Currently unavailable, and unfortunately no date known when it will be back
This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.
ISBN: 9781839682292
Dimensions: unknown
Weight: unknown
274 pages