Introduction to Optical Metrology
Format:Hardback
Publisher:Taylor & Francis Inc
Published:20th Aug '15
Currently unavailable, and unfortunately no date known when it will be back
Introduction to Optical Metrology examines the theory and practice of various measurement methodologies utilizing the wave nature of light. The book begins by introducing the subject of optics, and then addresses the propagation of laser beams through free space and optical systems. After explaining how a Gaussian beam propagates, how to set up a collimator to get a collimated beam for experimentation, and how to detect and record optical signals, the text:
- Discusses interferometry, speckle metrology, moiré phenomenon, photoelasticity, and microscopy
- Describes the different principles used to measure the refractive indices of solids, liquids, and gases
- Presents methods for measuring curvature, focal length, angle, thickness, velocity, pressure, and length
- Details techniques for optical testing as well as for making fiber optic- and MEMS-based measurements
- Depicts a wave propagating in the positive z-direction by ei(ωt – kz), as opposed to ei(kz – ωt)
Featuring exercise problems at the end of each chapter, Introduction to Optical Metrology provides an applied understanding of essential optical measurement concepts, techniques, and procedures.
"A good book for students and professionals to learn both basic and practical aspects of optical metrology."
—Mitsuo Takeda, Center for Optical Research and Education, Utsunomiya University, Japan
"The theory and practice of optical metrology is equally weighted in this book, an ideal combination for the instructor, student, and researcher."
—Ramen Bahuguna, San Jose State University, California, USA
"The author’s way of writing/explaining is very well adapted to students and practical-thinking persons. The didactics show the long experience of the author."
—W. Osten, University Stuttgart, Germany
ISBN: 9781482236101
Dimensions: unknown
Weight: 990g
449 pages