Advances in X-Ray Analysis

Springer Book Archives

The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. Following the recent tradition of alternating plenary lecture topics between X-ray diffraction and X-ray fluorescence at the confer­ ence. Total reflectance X-ray spectrometry takes advantage of con­ sideration of the geometry of the X-ray optics.The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. 1984. on the campus of the University of Denver. Following the recent tradition of alternating plenary lecture topics between X-ray diffraction and X-ray fluorescence at the confer­ ence. the plenary sessions dealt with topics of X-ray fluorescence. Prof. H. Aiginger presented a plenary lect~re on TOTAL REFLECTANCE X-RAY SPECTROMETRY which admirably described this relatively new technique. J. C. Russ discussed XRF AND OTHER SURFACE ANALYTICAL TECHNIQUES which gave an excellent overview of the role XRF plays in a modern analytical laboratory. J. E. Taggart. Jr. described THE ROLE OF XRF IN A MODERN GEOCHEMICAL LABORATORY and presented many case histories of the configura­ tion of analytical equipment in several geochemical laboratories. The plenary lectures demonstrated both the dynamic nature of research in X-ray fluorescence. and the important role X-ray spectrom­ etry plays in the arsenal of analytical methods found in modern labora­ tories. Total reflectance X-ray spectrometry takes advantage of con­ sideration of the geometry of the X-ray optics. Potentially. new sample types may be considered as X-ray fluorescence specimens using this technique.