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Modern Characterization of Electromagnetic Systems and its Associated Metrology

Magdalena Salazar-Palma author Tapan K Sarkar author Ming Da Zhu author Heng Chen author

Format:Hardback

Publisher:John Wiley & Sons Inc

Published:24th Aug '21

Should be back in stock very soon

Modern Characterization of Electromagnetic Systems and its Associated Metrology cover

New method for the characterization of electromagnetic wave dynamics

Modern Characterization of Electromagnetic Systems introduces a new method of characterizing electromagnetic wave dynamics and measurements based on modern computational and digital signal processing techniques.  The techniques are described in terms of both principle and practice, so readers understand what they can achieve by utilizing them.

Additionally, modern signal processing algorithms are introduced in order to enhance the resolution and extract information from electromagnetic systems, including where it is not currently possible. For example, the author addresses the generation of non-minimum phase or transient response when given amplitude-only data.

  • Presents modern computational concepts in electromagnetic system characterization
  • Describes a solution to the generation of non-minimum phase from amplitude-only data
  • Covers model-based parameter estimation and planar near-field to far-field transformation as well as spherical near-field to far-field transformation

Modern Characterization of Electromagnetic Systems is ideal for graduate students, researchers, and professionals working in the area of antenna measurement and design. It introduces and explains a new process related to their work efforts and studies.

ISBN: 9781119076469

Dimensions: 231mm x 160mm x 31mm

Weight: 953g

720 pages