Materials Reliability in Microelectronics III: Volume 309
Kenneth P Rodbell editor William F Filter editor Harold J Frost editor Paul S Ho editor
Format:Paperback
Publisher:Cambridge University Press
Published:5th Jun '14
Currently unavailable, and unfortunately no date known when it will be back
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
This non-fiction paperback, "Materials Reliability in Microelectronics III: Volume 309" from Kenneth P Rodbell, William F Filter, Harold J Frost & Paul S Ho, was published 5th June 2014 by Cambridge University Press.
ISBN: 9781107409484
Dimensions: 229mm x 152mm x 26mm
Weight: 680g
514 pages