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Electron Crystallography for Materials Research and Quantitive Characterization of Nanostructured Materials: Volume 1184

Peter Moeck editor Sven Hovmöller editor Stavros Nicolopoulos editor Sergei Rouvimov editor Valeri Petkov editor Milen Gateshki editor Phil Fraundorf editor

Format:Paperback

Publisher:Cambridge University Press

Published:5th Jun '14

Currently unavailable, and unfortunately no date known when it will be back

Electron Crystallography for Materials Research and Quantitive Characterization of Nanostructured Materials: Volume 1184 cover

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

This book combines the proceedings of Symposium GG, Electron Crystallography for Materials Research, and Symposium HH, Quantitative Characterization of Nanostructured Materials, both from the 2009 MRS Spring Meeting in San Francisco. Papers from Symposium GG focus on the fundamentals and recent progress in electron crystallography and associated strategies for structural fingerprinting of nanocrystals. Some consensus was reached regarding precession electron diffraction and electron diffraction tomography as instrumental breakthroughs leading to ab initio determinations of unknowns with high structural complexity. Some of these unknowns may only exist as nanocrystals. For Symposium HH, experts in a wide variety of probing techniques come together in an effort to find optimal, and often combined, approaches for determining atomic structure at the nanoscale - the problem at the core of nanotechnology.

ISBN: 9781107408203

Dimensions: 229mm x 152mm x 12mm

Weight: 310g

228 pages