Semiconductor Memories
Technology, Testing, and Reliability
Format:Hardback
Publisher:John Wiley & Sons Inc
Published:24th Sep '02
Currently unavailable, and unfortunately no date known when it will be back
Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.
* Memory cell structures and fabrication technologies.
* Application-specific memories and architectures.
* Memory design, fault modeling and test algorithms, limitations, and trade-offs.
* Space environment, radiation hardening process and design techniques, and radiation testing.
* Memory stacks and multichip modules for gigabyte storage.
"...a valuable reference..." (Microelectronics Reliability, Vol. 43, 2003)
ISBN: 9780780310001
Dimensions: 257mm x 183mm x 33mm
Weight: 1043g
480 pages