Aberration-Corrected Analytical Transmission Electron Microscopy

Rik Brydson editor

Format:Hardback

Publisher:John Wiley & Sons Inc

Published:23rd Sep '11

Currently unavailable, and unfortunately no date known when it will be back

Aberration-Corrected Analytical Transmission Electron Microscopy cover

The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).

“This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).”  (Imaging & Microscopy, 1 March 2012)

 

ISBN: 9780470518519

Dimensions: 236mm x 160mm x 20mm

Weight: 581g

304 pages