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Advances in Imaging and Electron Physics

Peter W Hawkes editor Martin Hÿtch editor

Format:Hardback

Publisher:Elsevier Science Publishing Co Inc

Published:4th Apr '24

Should be back in stock very soon

Advances in Imaging and Electron Physics cover

Advances in Imaging and Electron Physics, Volume 229 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

ISBN: 9780443296482

Dimensions: unknown

Weight: 450g

888 pages