Advanced Methods in Automatic Item Generation

Mark J Gierl author Hollis Lai author Vasily Tanygin author

Format:Hardback

Publisher:Taylor & Francis Ltd

Published:19th May '21

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Advanced Methods in Automatic Item Generation cover

Advanced Methods in Automatic Item Generation is an up-to-date survey of the growing research on automatic item generation (AIG) in today’s technology-enhanced educational measurement sector. As test administration procedures increasingly integrate digital media and Internet use, assessment stakeholders—from graduate students to scholars to industry professionals—have numerous opportunities to study and create different types of tests and test items. This comprehensive analysis offers thorough coverage of the theoretical foundations and concepts that define AIG, as well as the practical considerations required to produce and apply large numbers of useful test items.

ISBN: 9780367902933

Dimensions: unknown

Weight: 458g

246 pages