Thermal-Aware Testing of Digital VLSI Circuits and Systems
Format:Paperback
Publisher:Taylor & Francis Ltd
Published:30th Jun '20
Currently unavailable, and unfortunately no date known when it will be back
This paperback is available in another edition too:
- Hardback£58.99(9780815378822)
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level
Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques
This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips
ISBN: 9780367607098
Dimensions: unknown
Weight: 172g
118 pages