Thermal-Aware Testing of Digital VLSI Circuits and Systems

Santanu Chattopadhyay author

Format:Paperback

Publisher:Taylor & Francis Ltd

Published:30th Jun '20

Currently unavailable, and unfortunately no date known when it will be back

This paperback is available in another edition too:

Thermal-Aware Testing of Digital VLSI Circuits and Systems cover

This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level

Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques

This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips

ISBN: 9780367607098

Dimensions: unknown

Weight: 172g

118 pages