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Characterization, Testing, Measurement, and Metrology

Sunpreet Singh editor J Paulo Davim editor Chander Prakash editor

Format:Paperback

Publisher:Taylor & Francis Ltd

Published:4th Oct '24

£58.99

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Characterization, Testing, Measurement, and Metrology cover

This book presents the broad aspects of measurement, performanceanalysis, and characterization for materials and devices through advanced manufacturing processes. The field of measurement and metrology as a precondition for maintaining high-quality products, devices, and systems in materials and advanced manufacturing process applications has grown substantially in recent years.

The focus of this book is to present smart materials in numerous technological sectors such as automotive, bio-manufacturing, chemical, electronics, energy, and construction. Advanced materials have novel properties and therefore must be fully characterized and studied in-depth so they can be incorporated into products that will outperform existing products and resolve current problems.

The book captures the emerging areas of materials science and advanced manufacturing engineering and presents recent trends in research for researchers, field engineers, and academic professionals.

ISBN: 9780367554941

Dimensions: unknown

Weight: 376g

192 pages