Research for Practical Issues and Solutions in Computerized Multistage Testing

David Weiss editor Duanli Yan editor Alina von Davier editor

Format:Paperback

Publisher:Taylor & Francis Ltd

Publishing:23rd Dec '24

£46.99

This title is due to be published on 23rd December, and will be despatched as soon as possible.

Research for Practical Issues and Solutions in Computerized Multistage Testing cover

This volume presents a comprehensive collection of the latest research findings supporting the current and future implementations and applications of computerized multistage testing (MST).

As a sequel to the widely acclaimed Computerized Multistage Testing: Theory and Applications (2014) by Yan, von Davier, and Lewis, this volume delves into the experiences, considerations, challenges, and lessons learned over the past years. It also offers practical approaches and solutions to the issues encountered. The topics covered include purposeful MST designs, practical approaches for optimal design, assembly strategies for accuracy and efficiency, hybrid designs, MST with natural language processing, practical routing considerations and methodologies, item calibration and proficiency estimation methods, routing and classification accuracy, added value of process data, prediction and evaluation of MST performance, cognitive diagnostic MST, differential item functioning, robustness of statistical methods, simulations, test security, the new digital large-scale Scholastic Aptitude Test, software for practical assessment and simulations, artificial intelligence impact, and the future of adaptive MST.

This volume is intended for students, faculty, researchers, practitioners, and education officers in the fields of educational measurement and evaluation in the United States and internationally.

ISBN: 9780367207816

Dimensions: unknown

Weight: unknown

500 pages