Power, Thermal, Noise, and Signal Integrity Issues on Substrate/Interconnects Entanglement

Yue Ma author Christian Gontrand author

Format:Hardback

Publisher:Taylor & Francis Ltd

Published:28th Mar '19

Currently unavailable, and unfortunately no date known when it will be back

Power, Thermal, Noise, and Signal Integrity Issues on Substrate/Interconnects Entanglement cover

As demand for on-chip functionalities and requirements for low power operation continue to increase as a result of the emergence in mobile, wearable and internet-of-things (IoT) products, 3D/2.5D have been identified as an inevitable path moving forward. As circuits become more and more complex, especially three-dimensional ones, new insights have to be developed in many domains, including electrical, thermal, noise, interconnects, and parasites. It is the entanglement of such domains that begins the very key challenge as we enter in 3D nano-electronics. This book aims to develop this new paradigm, going to a synthesis beginning between many technical aspects.

ISBN: 9780367023430

Dimensions: unknown

Weight: 480g

226 pages